Shared Resources
Scanning Electron microscope (SEM) / Focused Ion Beam (FIB) – Auriga (Zeiss)
This SEM can combine high-resolution field emission scanning electron microscopy and precision-focused ion beam (FIB) etch and deposition. It has the application range for 2D and 3D characterization, and analysis. It is equipped with 3D characterization and visualization. The Auriga enables characterization of these structures via several methods, among them slice and view for 3D-reconstruction, backscattered electron imaging for phase-contrast characterization, as well as secondary ion imaging for grain contrast.
Electron Microprobe Analyzer (EMPA)
The electron microprobe is an electron microscope that has a nominal imaging resolution of 3 nm with six spectrometers for non-destructive X-ray microanalysis and imaging of solid samples up to 10 cm in size. The instrument has 5 wavelength-dispersive spectrometers (WDS) that permit the measurement of elements from B through U, and is set up for conventional microanalysis as well as trace-element analysis. In addition, this instrument is equipped with an energy-dispersive spectrometer, which is capable of X-ray count rates in excess of 200k cps and has high-speed X-ray mapping and quantitative microanalytical capabilities that rival the WDS.
Small Angle X-Ray Scattering (SAXS)
Small-angle X-ray scattering (SAXS) is a technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered materials. This is achieved by analyzing the elastic scattering behaviour of X-rays when travelling through the material, recording their scattering at small angles (typically 0.1 – 10°). It belongs to the family of small-angle scattering (SAS) techniques along with small-angle neutron scattering, and is typically done using hard X-rays with a wavelength of 0.07 – 0.2 nm. Depending on the angular range in which a clear scattering signal can be recorded, SAXS is capable of delivering structural information of dimensions between 1 and 100 nm.
Small Angle X-Ray Scattering (SAXS)
Small-angle X-ray scattering (SAXS) is a technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered materials. This is achieved by analyzing the elastic scattering behaviour of X-rays when travelling through the material, recording their scattering at small angles (typically 0.1 – 10°). It belongs to the family of small-angle scattering (SAS) techniques along with small-angle neutron scattering, and is typically done using hard X-rays with a wavelength of 0.07 – 0.2 nm. Depending on the angular range in which a clear scattering signal can be recorded, SAXS is capable of delivering structural information of dimensions between 1 and 100 nm.
X-Ray FLourescence Spectrometer (XRF)
X-Ray Fluorescence Spectroscopy (XRF) is a technique used to determine chemical composition by exciting sample material through bombardment with x-rays. The Bruker S2 PUMA is a state-of-the-art energy dispersive (ED) system equipped with a detector optimized for light element detection. Where the typical range of elements for an ED-XRF system is sodium through uranium, this detector extends the range down to carbon.
High Resolution X-Ray Diffractometer (XRD)
High resolution XRD for a variety of applications including powders.